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Global
Interconnects Corporation is now offering high quality, high value BIB Test
Probes. Our design and manufacture of burn in board test probes positions us as
a vendor of choice for semiconductor manufacturers, reliability test labs, burn
in test contractors. Our delivery offer of 3 weeks for new designs and 2 weeks
for repeat orders is unmatched for comparable products.
BIB
Test Probes are used for testing, qualification and verification of each and
every socket on any reliability, evaluation or burn-in board. All test probes
are manufactured to withstand multiple insertions. The attention to detail can
be found in aspects such as strain relief, fit and finish. BIB Test probes are
built to your tester connectors and wired to your specifications. Our BIB Test
Probes are warranted for one year and are shipped fully tested and qualified.
When you receive your BIB Test probe, it will work out of the box.
Global
Interconnects Corporation BIB Test Probes are engineered and manufactured to
precise tolerances for proper interface as well as ease of operation with their
complementary socket. BIB test probe contacts are designed to interface to the
socket, and articulate the contact elements just as the device would. Global
Interconnects Corporation BIB Test Probes can be custom designed and
manufactured for virtually any socket type regardless of pin count and pitch.
Global
Interconnects Corporation BIB Test probes uses advanced polymers in the probe
head interface, in combination with functional design and quality driven
manufacturing processes to ensure a quality product. Our probe head contacts have industrial standard nickel and gold plating to ensure low contact
resistance and long service life.
At
Global Interconnects Corporation all our efforts are geared towards providing
our customer with a top quality test probe that will work out of the box and for the
duration of your program.
Materials:
Torlon 4203, Black Delrin,
or other specified materials.
Contact Plating:
50 µ-inches Gold
over 200 µ-inches Nickel
Typical contact
resistance: Less than 100mΩ
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